The electrical resistance of Ni(50)Ti(30)Hf(20) and Ni(50)Ti(40.5)Hf(9.5) melt-spun ribbons during current-driven thermal cycles

Abstract

The electrical resistance of Ni₅₀Ti₃₀Hf₂₀ and Ni₅₀Ti_40.5Hf_9.5 alloys during stress assisted two way memory effect was investigated with the aim to deduce the relationship between electrical resistance and deformation across the transformation range. Results show an almost linear relationship although a crossing point between increasing and decreasing deformation may compromise the use of these alloys in actuators.